Job Description
Radiance Technologies, a rapidly growing employee‑owned company, is seeking a skilled candidate to join our Cyber Solutions Group. This individual will perform integrated circuit (IC) failure analysis with a primary focus on Scanning Electron Microscopy (SEM) and Focused Ion Beam (FIB) techniques. They will develop failure analysis (FA) methodologies for a wide range of IC designs and technology nodes, spanning from 300 nm down to 10 nm and smaller. The role requires configuring laboratory test and measurement equipment and being proficient in the operation of SEMs, FIBs, and other standard FA laboratory tools. They will also be responsible for documenting standard operating procedures for tools, processes, and techniques. Experience with optical systems and sample preparation equipment is a plus.
Required Skills:
US citizenship with the ability to obtain security clearance
Required Experience:
Minimum of 5 years’ operating, maintaining or servicing SEMs and FIBs
Desired Qualifications:
Experience with Thermo Fisher Systems
Experience with maintaining or servicing FA Lab equipment
Experience with circuit edit and sample preparation techniques
Experience with IC failure analysis
Experience with nano probing
Experience with soldering
Active Secret Clearance (or above)
Clearance:
Applicants selected may be subject to a government security investigation and must meet eligibility requirements for access to classified information.
Radiance Technologies is an Equal Opportunity Employer. All qualified applicants will receive consideration for employment without regard to race, color, religion, sex, sexual orientation, gender identity, national origin, disability, or protected veteran status.