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Job Description
- Drive the strategic definition and development of Design-for-Reliability (DfR) guidelines, collaborating with cross-functional subject matter experts to integrate reliability into early design stages.
- Define and lead the development of qualification hardware and test methodologies, managing internal teams and external vendors to ensure silicon and package verification.
- Execute comprehensive silicon and package qualification programs (including high-temperature operating life (HTOL), early life failure rate (ELFR), electrostatic discharge/latch-up (ESD/LU), biased highly accelerated stress test (b/HAST), etc.) and conduct in-depth failure analysis to resolve quality issues.
- Extract and analyze data from qualification programs, high-volume manufacturing, and field returns to identify failure mechanisms and trends for yield and reliability optimization.
- Develop and implement physics-based statistical quality and reliability models (including early life failure (ELF), time-dependent dielectric breakdown (TDDB), and negative bias temperature instability (NBTI)) to predict device failure mechanisms and lifetime behaviors.